Copper Mountain Epsilometer for Dielectric Materials Measurement

EOL/this product is obsolete and not available anymore from the manufacturer.

Benefits of the Copper Mountain Epsilometer 3 MHz to 6 GHz for Material Testing

• Developed in collaboration with Compass Technology.
  
• Applications in measurements of antenna radomes, microwave circuit materials, 5G, Bluetooth, Wifi, etc.
• Broad frequency range from 3 MHz to 6 GHz and can accommodate sheet specimens from 0.3 to 3 mm thick.

Epsilometer for Dielectric Materials Measurement

The Copper Mountain Technologies Epsilometer can be used in design and manufacturing of microwave circuit materials, antenna radomes, antenna substrates, packaging for wireless devices – 4G/LTE, WiFi, Bluetooth, 5G, IoT, etc. – and many other applications. The Epsilometer is used for measuring the dielectric properties of materials. It measures dielectric substrate materials at frequencies from 3 MHz up to 6 GHz and can accommodate sheet specimens 0.3 to 3 mm thick. The Epsilometer solution has been developed in collaboration with Compass Technology, a leading provider of material measurement solutions and systems.

The Epsilometer solution includes an R60 VNA with software, measurement fixture, Epsilometer software, and calibration sample.

• Frequency range 3 MHz to 6 GHz
• Impedance 50 Ω.
• Sheet thickness 0.3 to 3 mm
• The database is populated up to a permittivity of 25.
• Suitable for testing ceramics (sample surface must be flat).